Residual Stress Measurement


Residual stress measurement inside metal components.


  X-ray diffraction is used to measure the residual stress inside mechanical components and other building objects.  MIRRORCLE uses high-energy white X-ray, which enable deep and non-destructive measurements. Furthermore, the energy dispersive method allows measuring of complex shapes.




Residual stress distribution measurement instrument apparatus:





X-ray source MIRRORCLE-CV1

X-ray energy


Optical system Parallel optical system
Detector Germanium semiconductor detector
Sample shape Arbitrary
X-ray diameter Less than 500μm(※)
Measurement region Less than 1cm(※)
Maximum measurement depth Less than 1mm for steel(※)
Depth resolution Greater than 1μm(※)

※Depends on conditions of measurement                        







to Page top