X-Ray Fluorescence Analysis(XRF)


X-ray fluorescence analysis of all elements with ppm precision


  General X-ray fluorescence devices can only detect elements of atomic number up to 40 because of the low-energy X-ray used. Thus, large-scale synchrotrons, such as Spring-8, have been the only devices capable of analyzing heavy metals using X-ray fluorescence. With MIRRORCLE, X-ray fluorescence analysis of heavy metals can be easily performed; by selecting the target and varying the operational conditions, not only traces of light elements such as calcium, but also heavy elements such as lead can be detected.




Analysis apparatus  :  Total reflective X-ray fluorescence analysis beam line




Light source MIRRORCLE-CV1、CV4、6x
Measurement Energy range 3〜100keV
Quantitative Analysis Calibration curve method using standard samples








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