Small-Angle X-ray Scattering(SAXS)


  Small-angle X-ray scattering (SAXS) for the measurement of particle size and membrane thickness


  In SAXS, extremely low-angle X-rays scattered from a sample are detected, enabling the measurement of membrane thicknesses and particle sizes of the order of nanometers.
  In our measurement device, which uses the MIRRORCLE-CV series synchrotron light source, characteristic X-rays can be produced by interchanging the target.




Analysis setup  :  SAXS beam line






Light source MIRRORCLE-CV1
X-ray energy 10〜25keV

Measurement method


Angular dispersion or energy dispersion

Optical system Triple-slit optical system
Sample configuration (film thickness measurement) Film deposited onto a matrix by vaporization or other means
Sample configuration (particulate) Powder
Sample size Contact us
Mesurement renge

Tens of nm〜

Hundreds of nm








to Page top