XAFS
X-ray Absorption Fine Structure (XAFS)MIRRORCLE-CV4
MIRRORCLE-CV4 is perfect for advanced X-ray analysis.
1. High brilliance X-ray
10１３ (photons/sec/mrad2/mm2/0.1%λ)
2. High energy resolution beamline
5000 energy resolution of the XAFS can be done by 3m beam line.
Analysis detail
■ Specifications
| Energy Range | 10 keV ～ 25keV |
|---|---|
| Analysis Target atom | K share：Ga (31) ～ In (49) L share：Tl (81) ～ U (92) |
| Energy Resolution (E/DE) | 5,000 |
| Sample Form | Solid film |
| Sample thickness | few μm (depend on sample) |
| Sample size | About 1cm * 3cm |
■ Analysis example
Sample： Mo 10μm
Date Radius distribution function
contact
| Shiga Prefecture techno-factory #7 Nojihigashi 7-3-46, Kusatsu, SHIGA, 525-0058 Japan Promotion. Tel:+81-77-566-6362 Fax:+81-77-566-6368 e-mail: i@photon-production.co.jp |