The 20 MeV version of MIRRORCLE produces a brilliance, as defined by photon flux per unit solid angle and area, of about 10¹⁴ (photons/sec/mrad²/mm²/0.1%λ) as shown in table 1 and figure 1. The high brilliance and energy tunability makes laboratory based advanced analysis a reality. There are two methods to produce monochromatic X-rays, with the selected method based on experimental requirements. Method A is to generate low energy bremsstrahlung radiation from carbon or beryllium target. Then the bremmsstrahlung radiation is monochromatized by one crystal. Method B is to generate monochromatic X-ray directly from crystal target. Crystal target and downstream crystal completes as a double crystal monochromator. The X-ray energy is tunable with fixed sample position using either method.


Figure 1. The calculated brilliance in units of photons/sec/mrad²/mm²/0.1%λ. The output spectrum of 20 MeV model is compared to 6 MeV model for carbon target. Using the 20 MeV model, a laboratory size protein crystallography beamline can be constructed.



(A) White bremsstrahlung X-rays are monochromatized by a single crystal. The 20 MeV model produces X-rays with a deviation of ±1.5°. By rotating the crystal the final X-ray energy output is changed and resulting mechanism is can be considered part of a low cost beam line. The energy resolution of the monochromatic beamline is E/E = 1000 with 0.1 mrad aperture. A high energy X-ray may form background when bremsstrahlung radiation is used.

(B) A small crystal placed in the electron orbit generates directly monochromatic X-rays (Parametric X-ray radiation), and the observed spectrum change is shown in figure below. The X-ray energy is tunable with rotation of crystal target. Combining this crystal target with a second crystal, a double crystal monochromator beamline is formed. It takes about 1 second to change the X-ray energy. We can obtain monochromatic X-ray in the range of 8-30keV. The background is very low, because light axis of parametric X-ray radiation is different from the axis of bremsstrahlung radiation.


Figure 2. The beamline with method (B).





Figure 3. Monochromatic X-rays from Si (111) crystal target using MIRRORCLE-20SX with method (B). "Rotation angle of crystal" means the tangential direction of the beam orbit. The graph shows energy tunability rotating crystal target.
Detector : Si PIN photodiode.

Figure 4 shows the second upright monochromator chamber for MIRRORCLE-20SX. This system is located in the Omi MIRRORCLE Center in Ritto-city, Japan. MIRRORCLE-20SX was successfully commissioned, and is producing bright X-rays. There is a CCD detector downstream of a goniometer for protein structure analysis. The sample positon for protein crystal is 3.5 m distance from X-ray source point. The short beamline results in high intensity X-ray at the sample location.

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Success in the measurement of MIRRORCLE-20SX absolute X-ray intensity.

We have measured the monochromatized X-ray intensity through a sagittal monochrometer for 10-15 keV from MIRRORCLE-20SX. An imaging plate was used to compare the data from the X-ray tube. The same sagittal monochrometer was used for 900W Cu tube (8keV). In terms of brilliance, it corresponds to about 10¹² photons. Of course the difference between MIRRORCLE and any X-ray tube is the energy scanning capability of MIRRORCLE. We found that the measurement of the DXAFS spectrum can be made in 10 minutes. For the first time a laboratory sized XAFS or protein crystallography system is now possible. In the near future we will increase the X-ray flux by more than 100 times by implementing a new accelerator cavity. (Note: X-ray tube needs more power to produce 13.4keV X-ray)

Table 1. A comparison X-ray intensity between MIRRORCLE and X-ray tube.

	MIRRORCLE RAY 20 MeV	MIRRORCLE RAY 4 MeV	X-ray tube	Synchrotron Radiation Facility (8GeV Bending Magnet)
Figure of Radiation Mechanism
Source size	10 μm φ	10 μm φ	3mmφ (The case of Micro-focus; 10μmφ)	1 mm x 20 μm
Density @13keV (photons/sec/mrad2/0.1%λ)	1010 (Present Value: 108)	108 (Present Value: 108)	108  @8keV	1011
Brilliance@13keV (photons/sec/mrad2/mm2/0.1%λ)	1014 (Present Value: 1012)	1012 (Present Value: 1012)	(The case of Micro-focus; 1012  @8keV)	1015
Total Flux from X-ray port	10kW (Present Value: 100W)	15W	About 1 W	170 W

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Dispersive XAFS beamline

Dispersive XAFS (DXAFS) can be conducted using monochromatized white bremsstrahlung X-rays. MIRRORCLE RAY 20 MeV model is inherently suitable for DXAFS owing to its micrometre-size X-ray source point and wide radiation emission angle. DXAFS experiments can be performed with high energy resolution and over a wide range.




Fig5. The absorbance graph is changed from CCD X-ray image. The absorption edge or XAFS beats are observed. The XAFS sample is Mo foil (10 μm thickness), and we have used Si (220) monochromator.

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Table 2. The product for Monochromatic X-ray user

MIRRORCLE type:	20 MeV model (20ST)		MIRRORCLE RAY 4 MeV
X-ray emission scheme	Bremsstrahlung (e.g. 1 x 1 x 0.5 mm carbon target)	Parametric X-ray (e.g. 1 x 6 x 0.05 mm Si (111) target)	Bremsstrahlung (e.g. 1 x 1 x 0.5 mm carbon target)
Emitted X-ray	10 - 20000 keV (White X-ray)	8 - 30 keV (Monochromatic X-ray)	10 - 4000 keV (White X-ray)
Irradiation area	25 mrad Φ		125 mrad Φ
Maximum photon power	10 kW		15 W
Density (Brightness) [photons/s/mrad2/0.1% λ]	1010		108
Brilliance [photons/s/mrad2/mm2/0.1% λ]	1014		1012
Maximum power input	200 kVA		50 kVA
Total size	W 210 x D 450 x H 143 cm		W 60 x D 150 x H 60 cm
Total weight	3.75 t		1 t(with a Pb shield)

*1 MIRRORCLE's X-ray power very much depends on the vacuum level and is expected to improve over time.

Conveniently printable specifications with all models compared can be found in the Literature & CD section of this web site.

Due to continuous improvement, features, specifications and price are subject to change without notification.

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Reference:

• H. Yamada, AIP Conf. Proc. 902, pp.11-18, (2007).
• H. Yamada, T. Hanashima, M. Morita, and Y. Yano, AIP Conf. Proc. 902, pp.26-30, (2007).
• H. Yamada, H. Saisho, T. Hirai and J. Hirano, Spectrochimica Acta B 59, pp. 1323-1328, (2004).

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Laue pattern taken by MIRRORCLE-6X:

We show the measured Laue pattern from a sample SiO₂ crystal (Quartz) using white X-ray generated by common target using MIRRORCLE-6X.

X-ray Fluorescence Analysis:

MIRRORCLE technology can provide the X-ray levels necessary to perform X-ray fluorescence analysis of heavy elements. These examples show the spectrums for lead and platinum.

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